Secondary electron count imaging in SEM

Secondary electron emission in the scanning electron microscope

H. Seiler · Journal of Applied Physics · 1983 · 1K citations

Natural Sciences, Materials Engineering, Materials Science +11

Factors Affecting Contrast and Resolution in the Scanning Electron Microscope†

T. E. Evekhart, OC Wells, C.W. Oatley · Journal of Electronics and Control · 1959 · 120 citations

Natural Sciences, Materials Science, Optics +9

Quantitative Annular Dark Field Electron Microscopy Using Single Electron Signals

Ryo Ishikawa, Andrew R. Lupini, Scott D. Findlay et al. · Microscopy and Microanalysis · 2013 · 105 citations

Natural Sciences, Materials Engineering, Materials Science +15

Single‐image signal‐to‐noise ratio estimation

John T. L. Thong, K. S. Sim, J.C.H. Phang · Scanning · 2001 · 70 citations

Engineering, Bioengineering, Biomedical Imaging +16

Shot Effect of Secondary Electrons from Nickel and Beryllium

Bernhard Kurrelmeyer, Lucy J. Hayner · Physical Review · 1937 · 38 citations

Natural Sciences, Physics, Metallurgy +7