Publication | Open Access

Advancing the application of atomic force microscopy (AFM) to the characterization and quantification of geological material properties

Materials ScienceAtomic Force MicroscopyGeological Material PropertiesEngineeringElectron MicroscopyMicroscopyMicroscopy MethodScanning Probe MicroscopyApplied PhysicsScanning Force MicroscopyGeomechanicsMicroanalysisGeologyMicrostructure