Investigation of negative DIBL effect for ferroelectric-based FETs to improve MOSFETs and CMOS circuits - Concepedia

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Investigation of negative DIBL effect for ferroelectric-based FETs to improve MOSFETs and CMOS circuits

14

Citations

37

References

2021

Year

Weixing Huang, Huilong Zhu, Yongkui Zhang, Zhenhua Wu, Kunpeng Jia, Xiaogen Yin, Yangyang Li, Chen Li, Xuezheng Ai, Qiang Huo,

Microelectronics Journal

References

	Year	Citations

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