Annual Review of Materials Science · 1997 · 476 citations · 129 references
Natural SciencesMaterials EngineeringMaterials ScienceInterface ScienceSurface ChemistrySurface ScienceAtomic Force MicroscopyIntermolecular ForcesSurface Functionalization Of NanomaterialsSurface ModificationSurface PhysicsThin Film AdhesionAdhesion ForcesAdhesion MechanicsAdhesive ContactChemical Force MicroscopyForce-distance CurvesFrictionSelf-assembled MonolayersSurface Force Measurements
▪ Abstract Atomic force microscopy is an imaging tool used widely in fundamental research, although it has, like other scanned probe microscopies, provided only limited information about the chemical nature of systems studied. Modification of force microscope probe tips by covalent linking of organic monolayers that terminate in well-defined functional groups enables direct probing of molecular interactions and imaging with chemical sensitivity. This new chemical force microscopy technique has been used to probe adhesion and frictional forces between distinct chemical groups in organic and aqueous solvents. Contact mechanics provide a framework to model the adhesive forces and to estimate the number of interacting molecular groups. In general, measured adhesive and frictional forces follow trends expected from the strengths of the molecular interactions, although solvation also plays an important role. Knowledge of these forces provides a basis for rationally interpretable mapping of a variety of chemical functionalities and processes such as protonation and ionization.
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
CRC Handbook of Chemistry and Physics
Devendra Leena P · Journal of Molecular Structure · 1992 · 9.4K citations
Natural Sciences, Chemistry, Physics +12
Observation of a single-beam gradient force optical trap for dielectric particles
A. Ashkin, J. M. Dziedzic, J. E. Bjorkholm et al. · Optics Letters · 1986 · 7K citations