Scientific Reports · 2020 · 16 citations · 48 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSensorsCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyDigital Image ProcessingImage SensorsMetal-oxide-semiconductor Field-effect TransistorsPhotodetectorsAvalanche GainAvalanche MultiplicationCmos Image SensorsComplementary Metal-oxide-semiconductor Image SensorsComplementary Metal-oxide-semiconductor SensorsImage Sensor TechnologyReverse Bias CharacteristicsSignal Amplification Mechanisms
Abstract The recent improvements of complementary metal–oxide–semiconductor (CMOS) image sensors are playing an essential role in emerging high-definition video cameras, which provide viewers with a stronger sensation of reality. However, the devices suffer from decreasing sensitivity due to the shrinkage of pixels. We herein address this problem by introducing a hybrid structure comprising crystalline-selenium (c-Se)-based photoconversion layers and 8 K resolution (7472 × 4320 pixels) CMOS field-effect transistors (FETs) to amplify signals using the avalanche multiplication of photogenerated carriers. Using low-defect-level NiO as an electric field buffer and an electron blocking layer, we confirmed signal amplification by a factor of approximately 1.4 while the dark current remained low at 2.6 nA/cm 2 at a reverse bias voltage of 22.6 V. Furthermore, we successfully obtained a brighter image based on the amplified signals without any notable noise degradation.
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Natural Sciences, Materials Engineering, Materials Science +14