Publication | Open Access
Switching between attractive and repulsive Coulomb-interaction-mediated drag in an ambipolar GaAs/AlGaAs bilayer device
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Citations
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References
2016
Year
Wide-bandgap SemiconductorElectrical EngineeringCoulomb Drag ResistivityAmbipolar Device DesignEngineeringPhysicsNanoelectronicsApplied PhysicsCoulomb DragSemiconductor MaterialMultilayer HeterostructuresRepulsive Coulomb-interaction-mediated DragCharge Carrier TransportMicroelectronicsCharge TransportSemiconductor Device
We present measurements of Coulomb drag in an ambipolar GaAs/AlGaAs double quantum well structure that can be configured as both an electron-hole bilayer and a hole-hole bilayer, with an insulating barrier of only 10 nm between the two quantum wells. Coulomb drag resistivity is a direct measure of the strength of interlayer particle-particle interactions. We explore the strongly interacting regime of low carrier densities (2D interaction parameter rs up to 14). Our ambipolar device design allows a comparison between the effects of the attractive electron-hole and repulsive hole-hole interactions and also shows the effects of the different effective masses of electrons and holes in GaAs.
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