Electronics Letters · 2020 · 13 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceAcousticsMicroelectromechanical SystemsThin FilmsAcoustic MaterialsAcoustic PerformancePhysical AcousticsBulk Mode ResonatorsFilm Bulk Acoustic ResonatorsHarmonic ReductionParallel ResonancePiezoelectric ResonatorsResonator DesignSeries ResonanceSilicon
In this Letter, an active area optimisation technique to improve the performance parameters of the film bulk acoustic resonator (FBAR) is proposed. The active area of the back trench membrane‐based FBAR is optimised to remove the spurious modes, higher harmonic modes, and to confine the acoustic signal at its central part during the resonance. The effect of thickness variation of SiO 2 layer on the performance parameters was studied using finite‐element analysis (FEA) simulation. The SiO 2 film, on silicon substrate, was used as the support layer and zinc oxide was used as the piezoelectric film for the resonator. The authors have successfully demonstrated the FBAR through FEA for an optimised active area of 320 × 320 µm 2 , series resonance frequency ( f s ) 1.249 GHz, and parallel resonance frequency ( f p ) 1.273 GHz with an effective electromechanical coupling coefficient of 4.65%.
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Spurious resonance free bulk acoustic wave resonators
J. Kaitila, Markku Ylilammi, J. Ellä et al. · 2004 · 133 citations
Engineering, Physics, Acoustics +10
4E-3 Spurious Mode Suppression in BAW Resonators
Robert Thalhammer, J. Kaitila, Sebastian Zieglmeier et al. · 2006 · 49 citations