Concepedia

Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study

Wenhan Fu, Chen–Fu Chien, Lizhen Tang

Journal of Intelligent Manufacturing · 2020 · 46 citations · 43 references

References

43

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes

Ki Bum Lee, Sejune Cheon, Chang Ouk Kim · IEEE Transactions on Semiconductor Manufacturing · 2017 · 475 citations

Computing, Computer Science, Manufacturing Engineering +17

Bayesian Networks in Fault Diagnosis

Baoping Cai, Lei Huang, Min Xie · IEEE Transactions on Industrial Informatics · 2017 · 458 citations

Engineering, Systems Engineering, Model-based Systems Engineering +16

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Sejune Cheon, Hankang Lee, Chang Ouk Kim et al. · IEEE Transactions on Semiconductor Manufacturing · 2019 · 293 citations

Computing, Computer Engineering, Computer Science +17

Influences of variables on ship collision probability in a Bayesian belief network model

Maria Hänninen, Pentti Kujala · Reliability Engineering & System Safety · 2012 · 212 citations

Computing, Marine Engineering, Ocean Engineering +14

Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing

Shao-Chung Hsu, Chen–Fu Chien · International Journal of Production Economics · 2006 · 191 citations

Engineering, Computer Engineering, Manufacturing Engineering +17