Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS

Henry O. Ayoola, Cheng-Han Li, Stephen D. House, Cecile S. Bonifacio, Kim Kisslinger, Joerg R. Jinschek, Wissam A. Saidi, Judith C. Yang

Ultramicroscopy · 2020 · 23 citations · 51 references

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