Thermal-induced interface degradation in perovskite light-emitting diodes

Yatao Zou, Tian Wu, Fan Fu, Sai Bai, Lei Cai, Zhongcheng Yuan, Yajuan Li, Ruiying Li, Weidong Xu, Tao Song,

Journal of Materials Chemistry C · 2020 · 56 citations · 42 references

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Abstract

The poor operational stability remains a key challenge in perovskite light-emitting diodes. In this work, we investigate the detrimental effects of thermal-induced interface degradation on the device performance of perovskite light-emitting diodes.

References

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