Traceable and long-range grating pitch measurement with picometer resolution

Transmission EBSD from 10 nm domains in a scanning electron microscope

Robert R. Keller, Roy H. Geiss · Journal of Microscopy · 2011 · 386 citations

Natural Sciences, Materials Science, Physics +15

Dynamic analysis and PID control for a quadrotor

Jun Li, Yuntang Li · 2011 · 364 citations

Engineering, Mechanical Engineering, Mechatronics Engineering +16

Organic structure determination using atomic-resolution scanning probe microscopy

Fabian Mohn, Nikolaj Moll, Gerhard Meyer et al. · Nature Chemistry · 2010 · 337 citations

Natural Sciences, Chemistry, Materials Science +14

Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy

Nina Balke, Petro Maksymovych, Stephen Jesse et al. · ACS Nano · 2015 · 279 citations · Full text

Natural Sciences, Materials Science, Physics +16

Fast near field calculations in the discrete dipole approximation for regular rectilinear grids

Piotr J. Flatau, B. T. Draine · Optics Express · 2012 · 252 citations · Full text

Computing, Computer Science, Electrical Engineering +17