Publication | Closed Access

Fault diagnosis and prognosis based on physical knowledge and reliability data: Application to MOS Field-Effect Transistor

ReliabilityFault DiagnosisElectrical EngineeringReliability EngineeringEngineeringFault AnalysisDiagnosisStructural Health MonitoringSystems EngineeringCircuit ReliabilityMos Field-effect TransistorReliability PredictionDevice ReliabilityMicroelectronicsPhysical Knowledge