Publication | Closed Access
Triangular Single Shockley Stacking Fault Analyses on 4H-SiC PiN Diode with Forward Voltage Degradation
18
Citations
38
References
2020
Year
Electrical EngineeringForward Voltage Degradation4H-sic Pin DiodePower Semiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1