Acta Materialia · 2020 · 25 citations · 46 references
Materials ScienceEngineeringGete Thin FilmsCrystal Growth TechnologyApplied PhysicsNew InsightsThin Film Process TechnologyThin FilmsCrystal FormationThin Film ProcessingMicrostructureThermomechanical Behavior
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X-ray line broadening from filed aluminium and wolfram
G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10K citations