Applied Physics A · 2020 · 48 citations · 53 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials PhysicsSemiconductor MaterialsConductive MaterialsElectrical CharacterizationElectrical ConductivityElectrical Properties Of CeramicsElectronic Material CharacterizationInorganic MaterialsBarium TitanateConductionElectrical PropertiesElectrical Properties AnalysisElectronic ConductionOhmic ConductionSemiconductor Conductivity
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X-ray line broadening from filed aluminium and wolfram
G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations
The ‘universal’ dielectric response
A.K. Jonscher · Nature · 1977 · 5.5K citations
Dielectric relaxation in solids
A.K. Jonscher · Journal of Physics D Applied Physics · 1999 · 5.3K citations