Publication | Open Access

Impurity and texture driven HCP-to-FCC transformations in Ti-X thin films during in situ TEM annealing and FIB milling

Materials ScienceMaterials EngineeringEngineeringMaterial ProcessingTi-x Thin FilmsApplied PhysicsAlloy DesignSitu Tem AnnealingThin FilmsAlloy PhaseFib MillingThin Film ProcessingMicrostructure