Publication | Closed Access
Identifying Nanoscale Pinhole Defects in Nitroaryl Layers with Scanning Electrochemical Cell Microscopy
16
Citations
32
References
2019
Year
EngineeringMicroscopyElectron MicroscopyElectrochemical Cell MicroscopyMicroscopy MethodTunneling MicroscopyNanometrologyNanoscale ScienceNanoscale Pinhole DefectsMaterials ScienceMultilayered Aryl FilmPhysicsNanotechnologyMicroanalysisNanomaterialsNanometric DefectsSurface ScienceApplied PhysicsScanning Probe MicroscopyNitroaryl Layers
Abstract We are reporting the application of scanning electrochemical cell microscopy to probe and identify nanometric defects in a multilayered aryl film formed by aryldiazonium reduction. We have determined by numerical simulation that, due to pipette geometry restrictions, the best sensitivity towards pinhole size can be obtained when measuring small pinholes (≤10 nm) with moderately large pipette sizes (ca. 500 nm).
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