Publication | Closed Access
Capacitor-less dynamic random access memory based on a III–V transistor with a gate length of 14 nm
46
Citations
36
References
2019
Year
Non-volatile MemoryElectrical EngineeringGate LengthEngineeringEmerging Memory TechnologyComputer EngineeringMemory DeviceMemory DevicesIii–v TransistorSemiconductor MemoryMicroelectronicsMemory Reliability
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