A root-mean-square-error analysis of two-peak Gaussian and Lorentzian fittings of thin-film carbon Raman spectral data

Abstract

We perform two-Gaussian and two-Lorentzian peak fits for Raman spectral data corresponding to samples of thin-film carbon found in the scientific literature. We find that the “goodness-of-fit,” as determined through an evaluation of the root-mean-square-error, is best for the two-Gaussian peak case over most of the thin-film carbon genome, except for the graphitic carbon and ta-C:H regions. We speculate that this is related to the lower levels of disorder present within the graphitic carbon and ta-C:H regions.