International Journal of Thermophysics · 2019 · 12 citations · 27 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsElectrical CharacterizationElectronic Material CharacterizationOxide SemiconductorsSemiconductor Device MaterialsThin Film AnnealingThin Film Electrical PropertiesAnnealingAnnealing EffectsAnnealing ProcessesAnnealing Temperature EffectsAnnealing Time EffectsEnergy DissipationN-type Oxide SemiconductorsZinc Oxides
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Transparent <i>p</i>-type semiconductor: LaCuOS layered oxysulfide
Kazushige Ueda, Shin‐ichiro Inoue, S. Hirose et al. · Applied Physics Letters · 2000 · 330 citations