Concepedia

X-ray diffraction line profile analysis of KBr thin films

Triloki Triloki, B. K. Singh

Applied Physics A · 2016 · 84 citations · 36 references

DOI

Concepts

References

36

Physical Properties of Crystals

Materials Today · 2007 · 7.8K citations · Full text

, , +14

Elements of X-ray diffraction

H. Lipson · Contemporary Physics · 1979 · 3.5K citations

, , +9

III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum

G.K. Williamson, R.E. Smallman · Philosophical magazine · 1956 · 3.2K citations

, , +17

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

, , +16

Microstructural parameters from X-ray diffraction peak broadening

T. Ungár · Scripta Materialia · 2004 · 1.1K citations

, , +11