Advances in Materials Science and Engineering · 2019 · 46 citations · 47 references
EngineeringMicroscopyElectron MicroscopyMicroscopy MethodRadiologyHealth SciencesMaterials ScienceMaterials EngineeringMedical ImagingFib-sem Three-dimensional TomographyMicroanalysisTomography TechniqueCarbon-based MaterialsScanning Probe MicroscopyMaterials CharacterizationBiomedical ImagingApplied PhysicsElectron MicroscopeFib-sem 3DTomography3D Imaging
A review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based materials were discussed. The goal of this paper is to highlight the advances of FIB-SEM 3D reconstruction to reveal the high and accurate resolution of internal structures of carbon-based materials and provide suggestions for the adoption and improvement of the FIB-SEM tomography system for a broad carbon-based research to achieve the best examination performances and enhance the development of innovative carbon-based materials.
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