Concepedia

Characterization of 167 MeV Xe ion irradiated n-type 4H-SiC

M.J. Madito, T.T. Hlatshwayo, C. Mtshali, Ncholu Manyala, Z.M. Khumalo

Applied Surface Science · 2019 · 19 citations · 26 references

DOI

Concepts

References

26

On the use of SRIM for computing radiation damage exposure

R.E. Stoller, M.B. Toloczko, Gary S. Was et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2013 · 1.5K citations

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Raman Investigation of SiC Polytypes

Satοru Nakashima, Hisatomo Harima · physica status solidi (a) · 1997 · 916 citations

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Displacement energy surface in 3C and 6H SiC

Ram Devanathan, William J. Weber · Journal of Nuclear Materials · 2000 · 254 citations

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Raman spectroscopy study of heavy-ion-irradiated α-SiC

S. Sorieul, J-M. Costantini, L. Gosmain et al. · Journal of Physics Condensed Matter · 2006 · 230 citations

, , +17

Spatial characterization of doped SiC wafers by Raman spectroscopy

J. C. Burton, Luanhong Sun, M. Pophristić et al. · Journal of Applied Physics · 1998 · 215 citations · Full text

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