Optics Express · 2019 · 16 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsRadiation MeasurementInterferometryX-ray CrystallographyX-ray Data AnalysisX-ray DiffractionX-ray OpticsX-ray SpectroscopyControl Parameter SettingDuty Cycle ControlDuty Cycle EffectsInclination DeterminationParameter ControlScanning Electron Microscope MetrologyX-ray Imaging OpticsX-ray Reflectivity
Here we report on a non-destructive, spatially resolving and easy to implement quality and parameter control method for high aspect ratio X-ray absorption gratings. Based on angular X-ray transmission measurements, our proposed technique allows to determine the duty cycle, the transmittance, the height, as well as the local inclination of the absorbing grating structures. A key advantage of the presented method is a fast and extensive grating quality evaluation without the need of implementing an entire grating interferometer. In addition to the local and surface-based analysis using a scanning electron microscope, our non-destructive method provides global averaged macroscopic and spatially resolved grating structure information without the requirement of resolving individual grating lines.
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Hard-X-ray dark-field imaging using a grating interferometer
Franz Pfeiffer, Martin Bech, Oliver Bunk et al. · Nature Materials · 2008 · 1.1K citations
Natural Sciences, Physics, Radiology +14
Demonstration of X-Ray Talbot Interferometry
Atsushi Momose, Shinya Kawamoto, Ichiro Koyama et al. · Japanese Journal of Applied Physics · 2003 · 964 citations
Natural Sciences, Materials Science, Diagnostic Radiology +16
Fabrication of diffraction gratings for hard X-ray phase contrast imaging
C. David, J. Bruder, T. Rohbeck et al. · Microelectronic Engineering · 2007 · 218 citations