Near-field microscopy inspection of nano scratch defects on the monocrystalline silicon surface

Optical Coherence Tomography

David Huang, Eric A. Swanson, Charles P. Lin et al. · Science · 1991 · 13.7K citations

Engineering, Biomedical Engineering, Ophthalmology +16

Indentation fracture: principles and applications

Brian R. Lawn, Rodney Wilshaw · Journal of Materials Science · 1975 · 1.3K citations

Engineering, Materials Engineering, Materials Science +11

Semiconductor physics and devices

Materials Today · 2006 · 798 citations · Full text

Engineering, Materials Science, Physics +17

Near-field microscopy by elastic light scattering from a tip

F. Keilmann, Rainer Hillenbrand · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences · 2004 · 691 citations

Natural Sciences, Materials Science, Physics +17

Pseudoheterodyne detection for background-free near-field spectroscopy

N. Ocelic, Andreas Huber, Rainer Hillenbrand · Applied Physics Letters · 2006 · 572 citations

Natural Sciences, Physics, Biophotonics +16