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Non-equilibrium supersaturation behavior in a Cu/Sn/Cu interconnect induced by room temperature electromigration

Electrical EngineeringElectromigration TechniqueEngineeringPhysicsNanoelectronicsCu/sn/cu InterconnectApplied PhysicsRoom Temperature ElectromigrationNon-equilibrium Supersaturation BehaviorMicroelectronicsElectrochemical InterfaceInterconnect (Integrated Circuits)