Current Applied Physics · 2019 · 84 citations · 38 references
EngineeringMaterials EngineeringMaterials ScienceManufacturing ProcessesSemiconductor DevicesDamage MechanicsDefect ModelingFracture MechanicsMachiningSemiconductor ReliabilitySurface DegradationGrindingMicromechanical DamageSemiconductor Wafer InspectionSilicon Wafer ProcessingSubsurface Damage ReductionSurface Integrity
38