2018 · 18 citations · 10 references
EngineeringElectrical EngineeringOptoelectronicsPhotonicsSensorsLaser DiodesOptical DetectorsPhotodetectorsPhotonic Integrated CircuitsQuantum OptoelectronicsSilicon PhotonicsDemodulationDetector Quantum EfficiencyHigh-frequency OperationLasersQuantum EfficiencyQuantum Efficiency MeasurementTime-of-flight Image SensorsTime-of-flight Measurement
We investigate and demonstrate the first Ge-on-Si lock-in pixels for indirect time-of-flight measurements. Compared to conventional Si lock-in pixels, such novel Ge-on-Si lock-in pixels simultaneously maintain a high quantum efficiency and a high demodulation contrast at a higher operation frequency, which enable consistently superior depth accuracies for both indoor and outdoor scenarios. System performances are evaluated, and pixel quantum efficiencies are measured to be >85% and >46% at 940nm and 1550nm wavelengths, respectively, along with demodulation contrasts measured to be >0.81 at 300MHz. Our work may open up new routes to high-performance indirect time-of-flight sensors and imagers, as well as potential adoptions of eye-safe lasers (e.g. wavelengths > 1.4μm)) for consumer electronics and photonics.
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Structured-light 3D surface imaging: a tutorial
Jason Geng · Advances in Optics and Photonics · 2011 · 1.6K citations
High-performance Ge-on-Si photodetectors
Jürgen Michel, Jifeng Liu, Lionel C. Kimerling · Nature Photonics · 2010 · 1.6K citations
Solid-state time-of-flight range camera
Robert Lange, Peter Seitz · IEEE Journal of Quantum Electronics · 2001 · 683 citations
Lock-in Time-of-Flight (ToF) Cameras: A Survey
Sergi Foix, Guillem Alenyà, Carme Torras · IEEE Sensors Journal · 2011 · 629 citations · Full text
Cyrus Bamji, Patrick A. O’Connor, Tamer A. Elkhatib et al. · IEEE Journal of Solid-State Circuits · 2014 · 193 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +17