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Spectroscopic ellipsometry and morphological characterizations of nanocrystalline Hg1-xMnxO oxide diluted magnetic semiconductor thin films

DOI

45

Citations

38

References

2019

Year

M. Emam-Ismail, M. El-Hagary, E.R. Shaaban, S.H. Moustafa, G.M.A. Gad
Ceramics International

References

YearCitations

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