Thickness-dependent resistive switching in black phosphorus CBRAM

Shania Rehman, Muhammad Farooq Khan, Sikandar Aftab, Honggyun Kim, Jonghwa Eom, Deok‐kee Kim

Journal of Materials Chemistry C · 2019 · 58 citations · 35 references

Concepts

Abstract

The main challenge encountered by most 2D materials for their use in non-volatile memory technology is their low <italic>R</italic><sub>on/off</sub> ratio.

References

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