Three-dimensional force-field microscopy with optically levitated microspheres

Charles P. Blakemore, Alexander D. Rider, Sandip Roy, Qidong Wang, Akio Kawasaki, G. Gratta

Physical review. A/Physical review, A · 2019 · 46 citations · 34 references

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Concepts

Abstract

A sensing element that explores the features of optical tweezers and atomic force microscopy is developed and tested. In contrast to traditional methods, vectorial force fields are fully characterized.

References

34