Microelectronics Reliability · 2018 · 15 citations · 3 references
EngineeringElectrical EngineeringMicroelectronicsPower ElectronicsSemiconductor DevicesDevice CharacterizationGate Drive CircuitsTemperature MeasurementThermal ManagementThermal Properties Of SemiconductorsWide-bandgap Semiconductor DevicesJunction Temperature EstimationSemiconductor Temperature SensorsTemperature Dependence Of DiodesTemperature-dependent Electrical MeasurementsThermal Effects In Integrated CircuitsThermal Management Of Power Electronics
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Packaging and Reliability of Power Modules
Josef Lutz · 2014 · 39 citations