Microelectronics Reliability · 2018 · 12 citations · 11 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice ScalingNoiseNoise In Analog CircuitsNoise In Electronic DevicesNoise In Semiconductor DevicesSemiconductor ReliabilityDevice Noise CharacterizationLow-noise AmplifiersNoise In AmplifiersSemiconductor NoiseStress
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William A. Radasky, Carl E. Baum, Magnus Wik · IEEE Transactions on Electromagnetic Compatibility · 2004 · 414 citations