Design of electrical probe memory with TiN capping layer

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Natural Sciences, Materials Engineering, Materials Science +17

Properties of titanium nitride films prepared by direct current magnetron sputtering

Y.L. Jeyachandran, Sa. K. Narayandass, D. Mangalaraj et al. · Materials Science and Engineering A · 2006 · 177 citations

Natural Sciences, Materials Engineering, Materials Science +14

Electronic Switching Effect and Phase-Change Transition in Chalcogenide Materials

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Natural Sciences, Materials Science, Physics +16

Terabit-per-square-inch data storage using phase-change media and scanning electrical nanoprobes

C. David Wright, M. Armand, Mustafa M. Aziz · IEEE Transactions on Nanotechnology · 2006 · 120 citations

Engineering, Electrical Engineering, Materials Science +17

Thickness dependent microstructural and electrical properties of TiN thin films prepared by DC reactive magnetron sputtering

Hailong Liang, Jin Xu, Dayu Zhou et al. · Ceramics International · 2015 · 111 citations

Natural Sciences, Materials Engineering, Materials Science +16