Thermoluminescence Properties for X-ray of Cr-doped Al2O3 Ceramics

Abstract

We investigated the basic thermoluminescence (TL) characteristics of Cr-doped low-meltingpoint Al 2 O 3 . The concentration of Cr 2 O 3 in this study ranged from 0.01 to 1.0 wt%. Owing to the stabilization of the trapped state caused by Cr doping, we successfully improved the lowmelting-point Al 2 O 3 fading property dramatically. Then, the sensitivity of 0.05 wt% Cr-doped Al 2 O 3 to X-rays was about 4.8 times higher than that of the nondoped Al 2 O 3 , allowing the Al 2 O 3 to maintain its attractive properties to X-rays. Furthermore, the 0.05 wt% Cr-doped Al 2 O 3 had good properties for dosimetry owing to its high TL sensitivity, high reproducibility, high radiation resistivity, and high thermal stability in two dimensions. Finally, we demonstrated two-dimensional (2D) verifications of radiotherapy (RT) plans using Cr-doped Al 2 O 3 ceramic plates. The results had good agreement with RT plans.