Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements

Y. Zhou, C. V. Ambarish, Rachel G. Gruenke, Felix T. Jaeckel, Kari L. Kripps, D. McCammon, Kelsey M. Morgan, Dallas Wulf, S. Zhang, J. S. Adams,

Journal of Low Temperature Physics · 2018 · 11 citations · 9 references

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