Applied Physics Express · 2018 · 24 citations · 26 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesSemiconductor Thin FilmsThin Film Electrical PropertiesPhotodetectionPolycrystalline Semiconductor FilmsSemiconductor CharacterizationSilicon Thin FilmsX-ray Diffraction Analysis
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Katsuaki Toh, Takanobu Saito, Takashi Suemasu · Japanese Journal of Applied Physics · 2011 · 154 citations
Natural Sciences, Materials Engineering, Materials Science +17
Suguru Yachi, Ryota Takabe, Hiroki Takeuchi et al. · Applied Physics Letters · 2016 · 126 citations · Full text