Publication | Closed Access
Higher-eigenmode piezoresponse force microscopy: a path towards increased sensitivity and the elimination of electrostatic artifacts
25
Citations
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References
2018
Year
Electrostatic ArtifactsEngineeringMicroscopyMicrofabricationMicroscopy MethodBioelectronicsApplied PhysicsPath TowardsScanning Force MicroscopyScanning Probe MicroscopyElectrophysiologyBiomedical EngineeringPiezoelectric MaterialPiezoelectricityMedicineBiophysics
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