Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events - Concepedia

Concepedia

Publication | Open Access

Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events

DOI Full Paper Access

42

Citations

24

References

2018

Year

Enrico Di Russo, Ivan Blum, Jonathan Houard, M. Gilbert, G. Da Costa, D. Blavette, L. Rigutti

Ultramicroscopy

EngineeringElectron MicroscopyPhysicsMicroscopyCalibrationSpectroscopyCompositional AccuracyApplied PhysicsNatural SciencesScanning Probe MicroscopyMicroanalysisGan Power DeviceExperimental ParametersInstrumentationMultiple Evaporation Events

References

	Year	Citations

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