2006 · 22 citations · 9 references
EngineeringElectrical EngineeringAnalog ElectronicsMetrologyMicroelectronicsDevice CharacterizationNoiseNoise In Electronic DevicesNoise In Semiconductor DevicesNoise MeasurementPower QualityAccuracyElectronics NoiseIn Situ MeasurementNoise AnalysisNoise CharacterizationNoise In Power Semiconductor DevicesPower Supply NoiseTime Resolution
An in-situ measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply
9
Clock skew verification in the presence of IR-drop in the power distribution network
R. Saleh, Syed Zeeshan Hussain, Steffen Rochel et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2000 · 110 citations
Engineering, Computer Engineering, Electrical Engineering +17