Micro & Nano Letters · 2018 · 23 citations · 32 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsMaterials PhysicsSemiconductor MaterialsElectronic Band StructureElectronic Transport ModelingSemiconductor Device MaterialsStrain EngineeringThin Film StrainThin-film MaterialsBand GapBand Structure CalculationCarrier MobilityCarrier Transport MechanismsHeitler-london TheoryStrain EffectsStrain Effects On Electronic PropertiesTensile Strain
The electronic properties of germanium monosulphide (GeS) monolayer under tensile strain were investigated using first‐principles calculations. Our computations showed that the band gap of GeS monolayer was tuned from 1.96 to 2.72 eV via uniaxial and biaxial tensile strain in the range of 10%. Besides, two transitions involving indirect to direct and direct to indirect were triggered when GeS monolayer was applied 3.5 and 9% tensile strain in the zigzag direction, however this transition had not happened when the tensile strain was applied in the armchair and biaxial direction. The band gap variations of GeS monolayer with the tensile strain were explained using a bond nature mechanism based on the Heitler–London's exchange energy model. Moreover, upon applying external strain, the acoustic phonon limited carrier mobility of GeS monolayer had an enhancement with more than two orders of magnitude at 300 K, from to . These findings show that strain engineering is an effective way to tune the electronic properties of GeS monolayer and to extend the applications of GeS monolayer in the field of electronics and optoelectronics.
32
Generalized Gradient Approximation Made Simple
John P. Perdew, Kieron Burke, Matthias Ernzerhof · Physical Review Letters · 1996 · 211.5K citations · Full text
Natural Sciences, Chemistry, Physics +16
Projector augmented-wave method
Peter E. Blöchl · Physical review. B, Condensed matter · 1994 · 90.8K citations
Natural Sciences, Chemistry, Physics +17
Self-Consistent Equations Including Exchange and Correlation Effects
W. Kohn, L. J. Sham · Physical Review · 1965 · 63.2K citations · Full text