Concepedia

Publication | Closed Access

Nanoscale structural damage due to focused ion beam milling of silicon with Ga ions

DOI

46

Citations

12

References

2017

Year

Enrico Salvati, León Romano Brandt, Chrysanthi Papadaki, H. Zhang, Seyed Morteza Mousavi, D. Wermeille, Alexander M. Korsunsky
Materials Letters

References

YearCitations

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