Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces - Concepedia

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Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces

10

Citations

16

References

2017

Year

A. Bilbao‐Guillerna, Raghavendran Thiruvallur Eachambadi, Guillaume Cadot, Dragoş Axinte, J. Billingham, F. B. Stumpf, Susanne Beuer, Mathias Rommel

Journal of Materials Processing Technology

Ion ImplantationEngineeringSurface ScienceNumerical SimulationApplied PhysicsNovel ApproachContinuous TrenchIon BeamComputational ElectromagneticsFocused Ion BeamIon EmissionMicroelectronics

References

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