Publication | Open Access
Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation
14
Citations
29
References
2017
Year
Device ModelingElectrical EngineeringEngineeringElectronic EngineeringBias Temperature InstabilitySingle Event EffectsSingle-event-transient EffectsMicroelectronicsJunctionless Double-gate MosfetsDual-material GateSemiconductor Device
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