Publication | Closed Access
Ni and Ti silicide oxidation for CMOS applications investigated by XRD, XPS and FPP
16
Citations
18
References
2017
Year
Electrical EngineeringEngineeringOxidation ResistanceNanoelectronicsOxide ElectronicsSiliceneCmos ApplicationsChemistrySilicon On InsulatorMicroelectronics
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