Publication | Closed Access
The mechanism of an increase in electrical resistance in Al thin film induced by current stressing
34
Citations
19
References
2017
Year
Materials ScienceElectrical ResistanceElectrical EngineeringAluminium NitrideEngineeringSpecific ResistanceStress-induced Leakage CurrentApplied PhysicsThin FilmsAl Thin FilmCurrent StressingThin Film ProcessingElectrical Insulation
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