Publication | Open Access

A Simple Marker-Assisted 3D Nanometer Drift Correction Method for Superresolution Microscopy

Super-resolution ImagingEngineeringMicroscopyNanotechnologyMicrofabricationSuperresolution MicroscopyBiomedical ImagingApplied PhysicsMicroscopy MethodScanning Force MicroscopyNanometrologySuper-resolutionSuper-resolution MicroscopyBiomedical EngineeringMedicineSimple Marker-assisted 3DBiophysics