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Determination of the optical constants of As–Se–Ag chalcogenide thick films with high precision for optoelectronics applications

Optical MaterialsEngineeringOptoelectronic DevicesThin Film Process TechnologyOptical CharacterizationSemiconductorsOptical PropertiesHigh PrecisionCompound SemiconductorThin Film ProcessingMaterials ScienceOptoelectronic MaterialsSemiconductor MaterialElectronic MaterialsOptoelectronics ApplicationsApplied PhysicsThin FilmsOptoelectronicsOptical Constants