Analytical Model of Correlation Factor for Human-Body Model to Transmission-Line Pulse ESD Testing

Abstract

Physics of correlation between standard ESD testing and transmission line pulse test results on semiconductor devices using a simple resistor (R) inductor (L) capacitor (C) circuit model approach is presented. The correlation is not a constant factor, however, it can be used to evaluate the time to failure for the device during the human-body model event and is attributed to the time to induce the thermal runaway of the device during the electrostatic-discharge event.