Advanced Materials Interfaces · 2017 · 16 citations · 44 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsMaterials PhysicsSemiconductor MaterialsMetal OxidesOxide SemiconductorsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesSurface PhysicsBand AlignmentBand BendingBand OffsetsElectron Energy-loss SpectroscopyEnergy-level AlignmentHeterojunctionsInterfacial Charge TransferMolecular Beam Epitaxy
The electronic properties of LaFeO 3 /LaMnO 3 epitaxial heterojunctions are investigated to determine the valence and conduction band offsets and the nominal Mn and Fe valence states at the interface. Studying a systematic series of (LaFeO 3 ) n /(LaMnO 3 ) m bilayers ( m ≈ 50) epitaxially grown in the (001) orientation using molecular beam epitaxy, layer‐resolved electron energy loss spectroscopy reveals a lack of significant interfacial charge transfer, with a nominal 3+ valence state observed for both Mn and Fe across the interface. Through a combination of variable angle spectroscopic ellipsometry and hard X‐ray photoelectron spectroscopy, type I energy level alignments are obtained at the LaFeO 3 /LaMnO 3 interface with positive valence and conduction band offsets of (1.20 ± 0.07) eV and (0.5–0.7 ± 0.3) eV, respectively, with minimal band bending. Variable temperature resistivity measurements reveal that the bilayers remain insulating and that the presence of the heterojunction does not result in a conducting interface.
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